THIN-FILM TECHNOLOGY & NANOENGINEERING

Scanning Probe Microscope (SPM) platforms for surface and nano-mechanical characterization of nanomaterials (thin films, polymers, nanoparticles ect) and nanosystems. The SPM platform supports:

- Atomic Force Microscope scanning in Contact, Tapping and non-Contact modes,
- Scanning Tunneling Microscopy
- Atomic Force Acoustic Microscopy (Surface mechanical properties),
- Scanning in Liquid head and nitrogen environment
- Heating Stage (up to 300 ºC).